Calibration Targets


  • Microscope Slides & Reticles for Imaging System Calibration
  • Soda Lime or UV Fused Silica Substrates with Chrome Plating

R1L3S1P

Stage Micrometer
with 50 µm Divisions

R3L3S3P

Concentric Squares Target,
0.1 mm to 50 mm

R2L2S3P1

Grid Distortion Target,
125 µm Grid Spacing

R1L3S12N

Ronchi Ruling Target,
10 lp/mm Pattern

R3L3S5P

Concentric Circles and Crosshairs Grid Target

R1DS2P

Concentric Circles Reticle

Related Items


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General Specifications
Optic Type Slides & Targets Reticlesa
Chrome Thickness 0.120 µm
Chrome Optical Density OD ≥3 at 430 nm
Substrate Thickness 0.06" (1.5 mm)
Surface Flatness ≤15 µm N/A
Surface Quality N/A 60-40 S-D
Transmitted Wavefront Error N/A <λ at 633 nm
Line Spacing Toleranceb ±1 µm N/A
Line Width Toleranceb ±0.5 µm N/A
Diameter Tolerance N/A +0.0/-0.1 mm
Substrate Soda Lime Glass UV Fused Silicac
  • Click here for the full reticles web presentation.
  • This tolerance is valid for the mask used to create these targets and may differ minimally for the targets themselves.
  • Click the link for detailed substrate specifications.
Test Target
Click to Enlarge

An R3L3S3P Stage Micrometer Mounted in an XYF1 Test Target Positioner

Quick Links

Thorlabs' calibration targets include stage micrometers, concentric squares and circles, distortion targets, and reticles for calibrating an imaging system. Square and rectangular targets feature soda lime glass substrates with vacuum-sputtered, low-reflectivity chrome, while our reticles feature UV fused silica substrates and high-reflectivity chrome. Each pattern is manufactured using photolithography, allowing for edge features to be resolved down to approximately 1 µm.

Mounting
Rectangular calibration targets can be mounted in many of our microscope slide holders, such as general fixed slide holders, microscope slide holders, and translation stages for microscopy. We also offer fixed optic holders for mounting reticles.

Targets Selection Guide
Resolution Test Targets Calibration Targets Distortion Test Targets Slant Edge MTF Target Stage Micrometers
Substrates Spectra
Click to Enlarge

Soda Lime Glass Transmission
Substrates Spectra
Click to Enlarge

Spectral Curves of Reflective Test Targets
The large difference between the chrome (blue line) and low-reflectivity chrome (red line) in the visible region means that the positive reflective targets have high contrast between the pattern and the background.
UV Fused Silica Transmission Curve
Click to Enlarge

The transmission plot was measured at normal incidence using a UV fused silica substrate that was 1.0 mm thick. The transmission for the reticles sold here will be slightly lower because of their 1.5 mm thickness.

Jason Williamson
General Manager
Thorlabs Spectral Works
Questions?
Need a Quote?
Contact Me
Customization Parameters
Substrate Sizea Min 8 mm x 8 mm (5/16" x 5/16")
Max 85 mm x 85 mm (3.35" x 3.35")
Substrate Materials Soda Lime Glass
UV Fused Silica
Quartz
Coating Material Chromeb
Low-Reflectivity Chromec
Coating Optical Density ≥3d or ≥6e @ 430 nm
Minimum Pinhole/Spot Ø1 µm
Minimum Line Width 1 µm
Line Width Tolerance -0.25 / +0.50 µm
Maximum Line Density 500 lp/mm
  • Substrates can be diced to custom shapes and sizes.
  • Chrome Reflectance >40% at 430 nm
  • Low-Reflectivity Chrome Reflectance >10% at 430 nm
  • Optical densities of ≥3 at 430 nm for UV fused silica substrates and standard soda lime substrates.
  • Optical density of ≥6 at 430 nm for quartz substrates and select soda lime substrates. 

Custom OEM Test Targets and Reticles

Our in-house photolithographic design and production capabilities enable us to create a range of patterned optics. We manufacture test targets, distortion grids, and reticles at our Thorlabs Spectral Works facility in Columbia, South Carolina. These components have served a wide variety of applications, being implemented in microscopes, imaging systems, and optical alignment setups.

In addition to our catalog test targets and reticles offered from stock, we can provide custom chrome patterns on soda lime, UV fused silica, or quartz substrates from 8 mm by 8 mm up to 85 mm by 85 mm. Substrates can be cut to shape for your application. Our photolithographic coating process allows us to create chrome features down to 1 µm. A few sample patterns are shown below, which can be made positive or negative, as shown in the image directly below.

For a quote on custom test targets and reticles, please contact us at TSW@thorlabs.com.

Example Applications

  • Etched Reticles
  • Gray Scale Masks
  • Resolution Reticles
  • Diagnostic Reticles
  • Recreational Scopes
  • Notching Reticles
  • Eyepiece Scales
  • Illuminated Crosshairs
  • Obstruction Targets
  • Binocular Reticles

Click to Enlarge

Positive and Negative Crosshair Sample Pattern

This tab details an optimal cleaning technique developed by our engineers for cleaning reticles, test targets, distortion targets, and calibration targets.

Cleaning Procedure

  1. Use a clean wet sponge, preferably made of polyvinyl alcohol (PVA), and dish detergent to gently scrub the front and back surfaces of your reticle or target.
  2. Rinse with water.
  3. Blow dry with clean dry air, or allow the reticle or target to air dry on a clean surface.

We do not suggest using a towel, rag, or wipe to dry the surface. If contamination persists, soak the reticle or target in a detergent and water solution for 1 hour, repeating as necessary.


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Stage Micrometer, 1" x 1"

Horizontal Micrometer
Click to Enlarge

Close Up of the R1L1S5P Horizontal Scale with Crosshair
  • 1" x 1" (25.4 mm x 25.4 mm) Stage Micrometer
  • For Calibrating Eyepiece Reticles or Objective Magnification
  • 20 mm Horizontal Scale with 100 µm Divisions and Crosshair

This target features a stage micrometer pattern with 100 µm divisions and numerical labeling every 1 mm. The pattern is oriented horizontally with a 20 mm long scale and a perpendicular crosshair. The target consists of a 1" x 1" soda lime substrate with low-reflectivity, vacuum-sputtered chrome. This positive target is useful for the calibration of distances within imaging systems.

Based on your currency / country selection, your order will ship from Newton, New Jersey  
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R1L1S5P Support Documentation
R1L1S5P20 mm Stage Micrometer with 100 µm Divisions, 1" x 1", Soda Lime Glass
$146.12
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Stage Micrometers, 3" x 1"

Stage Micrometer
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Microscope Image of R1L3S1P Stage Micrometer
  • For Calibrating Eyepiece Reticles or Objective Magnification
  • R1L3S1P: 10 mm Scale with 50 µm Divisions
  • R1L3S2P: 1 mm Scale with 10 µm Divisions
  • Scales Centered on a 3" x 1" (76.2 mm x 25.4 mm) Microscope Slide

These targets each feature a horizontal stage micrometer pattern. The R1L3S1P micrometer has a 10 mm long scale with 50 µm divisions and numerical labeling every millimeter, while the R1L3S2P has a 1 mm long scale with 10 µm divisions and numerical labeling every 0.1 mm. Both targets consist of a 3" x 1" soda lime substrate with low-reflectivity, vacuum-sputtered chrome. These positive targets are useful for the calibration of distances within imaging systems.

R1L3S1P
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R1L3S1P Under Magnification
R1L3S2P
Click for Details

R1L3S2P Under Magnification
Based on your currency / country selection, your order will ship from Newton, New Jersey  
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R1L3S1P Support Documentation
R1L3S1P10 mm Stage Micrometer with 50 µm Divisions, 3" x 1", Soda Lime Glass
$212.64
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R1L3S2P Support Documentation
R1L3S2P1 mm Stage Micrometer with 10 µm Divisions, 3" x 1", Soda Lime Glass
$188.88
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Concentric Squares Test Target, 3" x 3"

Concentric Squares
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R3L3S3P Concentric Square Pattern
Concentric Squares
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Close Up of the Squares Smaller than 15 mm Wide on R3L3S3P Concentric Square Target
  • 3" x 3" (76.2 mm x 76.2 mm) Concentric Square Target
  • Calibrate a Measurement for Imaging Software
  • Low-Reflectivity, Vacuum-Sputtered Chrome

The R3L3S3P Concentric Square Target features fourteen concentric squares with lengths and widths ranging from 0.1 mm to 50 mm (see table below). Each square is labeled with its width on the target. This target is made from a soda lime glass substrate with low-reflectivity, vacuum-sputtered chrome. These positive targets are useful for the calibration of distances within imaging systems.

 

Widths of Positive Squares (mm)
  • 0.1 • 0.5 • 2 • 4 • 10 • 20 • 40
  • 0.25 • 1 • 3 • 5 • 15 • 30 • 50
Based on your currency / country selection, your order will ship from Newton, New Jersey  
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R3L3S3P Support Documentation
R3L3S3PPositive Concentric Square Test Target, 3" x 3", Soda Lime Glass
$424.09
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Single-Frequency Ronchi Ruling Targets, 3" x 1"

Ronchi Ruling
Click to Enlarge

Close Up of R1L3S14N Ronchi Ruling Pattern
Optical Specifications
Pattern LRa Chrome
Background Clear
Chrome Optical Densityb ≥3.0
  • Low-Reflectivity
  • Specified at 430 nm.
  • 3" x 1" (76.2 mm x 25.4 mm) Square Wave Ronchi Ruling Target
  • Patterns with 10 lp/mm, 20 lp/mm, 40 lp/mm, and 80 lp/mm
  • Large 65 mm x 17 mm Clear Aperture
  • Determine Resolution, Field Distortion, and Parfocal Stability in an Optical System
  • Low-Reflectivity, Vacuum-Sputtered Chrome on Soda Lime Glass
  • Compatible with our MLS203 Microscope Stages via MLS203P2 Slide Holder

Thorlabs offers four versions of Ronchi ruling targets with resolutions ranging from 10 line pairs (one light line and one dark line) per millimeter (lp/mm) to 80 lp/mm. These square wave, constant-interval bar and space patterns are fabricated from the deposition of a low-reflectivity chrome pattern on a 3.00" x 1.00" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) soda lime glass substrate. This leaves a large 65 mm x 17 mm clear aperture, and works well in back-lit and highly illuminated applications. The dimensions of the glass substrate are the same as a standard microscope slide. These Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability in optical systems.

Based on your currency / country selection, your order will ship from Newton, New Jersey  
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R1L3S12N Support Documentation
R1L3S12NRonchi Ruling Test Target, 3" x 1", 10 lp/mm
$164.67
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R1L3S13N Support Documentation
R1L3S13NRonchi Ruling Test Target, 3" x 1", 20 lp/mm
$164.67
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R1L3S14N Support Documentation
R1L3S14NRonchi Ruling Test Target, 3" x 1", 40 lp/mm
$164.67
Today
R1L3S15N Support Documentation
R1L3S15NRonchi Ruling Test Target, 3" x 1", 80 lp/mm
$164.67
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Concentric Circles and Crosshairs Grid Target, 3" x 3"

NBS 1952
Click to Enlarge

Close Up of the Smaller Grid on the R3L3S5P Target with Labels Added (See Tables Below)
NBS 1952
Click to Enlarge

Close Up of Entire Pattern on the R3L3S5P Target
Optical Specifications
Pattern LRa Chrome
Background Clear
Surface Flatness ≤15 µm
Chrome Optical Densityb ≥3.0
  • Low-Reflectivity
  • Specified at 430 nm.
  • Concentric Circles and Crosshair Patterns Arranged in a Grid
  • Four Different Concentric Circle Sizes and Five Different Crosshair Sizes
  • Measure Resolution, Distortion, and Magnification of an Imaging System
  • 3" x 3" (76.2 mm x 76.2 mm) Soda Lime Glass Substrate

Thorlabs' 3" x 3" (76.2 mm x 76.2 mm) Concentric Circles and Crosshairs Grid Target offers 289 individual grids, arranged in a larger, 2" x 2" grid of 17 rows and 17 columns. The smaller grids each have four concentric circle patterns and five crosshair patterns of varying sizes. The concentric circle and crosshair patterns on the smaller grids are labeled in the image to the right but not on the target itself. Each concentric circle pattern features seven different radii, while the crosshairs each have a single or a double cross. For details on the dimensions of these patterns, see the tables below.

The pattern on this target is made from plating low-reflectivity, vacuum-sputtered chrome on a 0.06" (1.5 mm) thick soda lime glass substrate to achieve an optical density of ≥3 at 430 nm. The dark pattern and clear substrate are useful for front-lit and general applications.

Concentric Circles
Circle Patterna R1 R2 R3 R4 R5 R6 R7
A1 31.3 µm 62.5 µm 125 µm 140.6 µm 234.4 µm 242.2 µm 500 µm
A2 15.6 µm 31.3 µm 62.5 µm 70.3 µm 117.2 µm 121.1 µm 250 µm
A3 7.8 µm 15.6 µm 31.3 µm 35.2 µm 58.6 µm 60.5 µm 125 µm
A4 3.9 µm 7.8 µm 15.6 µm 17.6 µm 29.3 µm 30.3 µm 62.5 µm
  • As indicated by the photo above and to the right.
Crosshairs
Crosshair Patterna Single or Double Line Length/Width Line Widthb
B1 Double 500 µm 6.25 µm
B2 Double 500 µm 12.5 µm
B3 Single 500 µm 50 µm
B4 Double 500 µm 25 µm
B5 Double 500 µm 100 µm
  • As indicated by the photo above and to the right.
  • The line width is equal to the spacing between the lines.
Based on your currency / country selection, your order will ship from Newton, New Jersey  
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R3L3S5P Support Documentation
R3L3S5PPositive Concentric Circles and Crosshairs Grid Target, 3" x 3"
$605.84
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Combined Resolution and Distortion Test Targets, 18 mm x 18 mm

Combined Resolution Test Target
Click to Enlarge

Microscope Image of the R1S1L1N Negative Test Target
Optical Specifications
Item # R1L1S1P R1L1S1N
Pattern LRa Chrome Clear
Background Clear LRa Chrome
Chrome Optical Densityb ≥3.0
  • Low-Reflectivity
  • Specified at 430 nm.
  • Determine Resolution of an Optical System
  • Measure Image Distortion, Astigmatism, and Other Aberrations
  • 18 mm (0.71") Square, 1.5 mm Thick Soda Lime Substrate
  • Includes 1951 USAF Pattern, Sector Star, Concentric Circles, Grids, and Ronchi Rulings
  • Positive and Negative Targets Available

Thorlabs offers positive and negative 18 mm x 18 mm x 1.5 mm combined resolution / distortion test targets that are made by plating low-reflectivity, vacuum-sputtered chrome with an optical density (OD) of ≥3.0 at 430 nm on a soda lime glass substrate. They are ideal for the calibration of imaging systems and microscope stages.

The test targets include a 1951 USAF pattern (Groups 2 - 7), a sector star, concentric circles, grids (100 µm, 50 µm, and 10 µm), and Ronchi rulings (30 - 150 lp/mm). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The 1951 USAF targets are useful for measuring imaging resolution. The grids can be used to measure image distortion, while the concentric circles are ideal for identifying focus errors, astigmatism, and other aberrations existing in an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability. For more information, please see our Resolution Targets page.

These resolution targets are offered in positive and negative versions. The R1L1S1P positive target consists of a low-reflectivity chrome pattern plated on to a clear substrate and is useful for front-lit and general applications. Alternatively, the R1L1S1N negative target uses the same low-reflectivity chrome coating to cover the substrate, leaving the pattern itself clear, and works well in back-lit and highly illuminated applications.

Target Feature Details Target Feature Details
1951 USAF Target Groups 2 - 7 Concentric Circles 10 Circles with Radii from 100 µm to 1000 µm in 100 µm Intervals, Labeled 1 to 10
Grids 20 x 20 Arrays with 100 µm, 50 µm, and 10 µm Pitch Ronchi Rulings 13 Rulings from 30 lp/mma to 150 lp/mm in 10 lp/mm Intervals
Sector Star 36 Bars through 360°, 10 µm Radius Center Circle, and Ten Concentric Circles with Radii from 50 µm to 500 µm in 50 µm Intervals
  • Line Pairs per Millimeter
Based on your currency / country selection, your order will ship from Newton, New Jersey  
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R1L1S1P Support Documentation
R1L1S1PCustomer Inspired! Positive Combined Resolution and Distortion Test Target, 18 mm Square
$588.02
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R1L1S1N Support Documentation
R1L1S1NCustomer Inspired! Negative Combined Resolution and Distortion Test Target, 18 mm Square
$588.02
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Fixed Frequency Grid Distortion Targets, 1.5" x 1.5"

R2L2S3P3 Application
Click to Enlarge

An R2L2S3P3 Target Post Mounted via an FFM1 Filter Mount and a B3C Cube Base for Use in a Custom Imaging System
R2L2S3P4 Close Up
Click for Details

A Close Up of the Dot Pattern on the R2L2S3P4 Target
  • One Grid Array on a 1.5" x 1.5" (38.1 mm x 38.1 mm) Soda Lime Glass Substrate
  • 125 µm, 250 µm, 500 µm, or 1000 µm Grid Spacings
  • Ø62.5 µm, Ø125 µm, Ø250 µm, or Ø500 µm Dots
  • Ideal for Machine Vision Applications of Stage Calibration and Distortion Detection

These distortion grid arrays each feature a single grid of dots fabricated from the deposition of vacuum-sputtered, low-reflectivity chrome on a soda lime glass substrate. The available grid spacings, which are measured from the center of any dot to the center of any adjacent dot, range from 125 µm to 1000 µm, and the dot diameters range from 62.5 µm to 500 µm.

Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical rows of dots should be perpendicular to each other. A distorted image will show the array as bowed; this image can then be used to correct for distortion.

Item # Spacinga Spacing
Tolerance
Dot Size Dot Size
Tolerance
Pattern Background Pattern Sizeb Pattern Size
Tolerance
Pattern
Optical Density
Substrate Size
R2L2S3P1 125 µm ±1 µm Ø62.5 µm ±2 µm Low-Reflectivity
Chrome
Clear 25.0 mm x 25.0 mm
(0.98" x 0.98")
±4 µm OD ≥3.0 at 430 nm 1.5" x 1.5" x 0.06"
(38.1 mm x 38.1 mm x 1.5 mm)
R2L2S3P2 250 µm Ø125 µm
R2L2S3P3 500 µm Ø250 µm 25.4 mm x 25.4 mm
(1" x 1")
R2L2S3P4 1000 µm Ø500 µm
  • Measured from the center of any dot to the center of any adjacent dot.
  • Measured from corner to corner on the grid array.
Based on your currency / country selection, your order will ship from Newton, New Jersey  
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R2L2S3P1 Support Documentation
R2L2S3P1Customer Inspired! Grid Distortion Target, 1.5" x 1.5", 125 µm Grid Spacing
$454.97
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R2L2S3P2 Support Documentation
R2L2S3P2Customer Inspired! Grid Distortion Target, 1.5" x 1.5", 250 µm Grid Spacing
$388.47
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R2L2S3P3 Support Documentation
R2L2S3P3Customer Inspired! Grid Distortion Target, 1.5" x 1.5", 500 µm Grid Spacing
$333.81
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R2L2S3P4 Support Documentation
R2L2S3P4Customer Inspired! Grid Distortion Target, 1.5" x 1.5", 1000 µm Grid Spacing
$302.92
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Multi-Frequency Grid Distortion Target, 3" x 1"

Grid Array
Click to Enlarge

Close Up of the Four Grid Patterns on the R1L3S3P Target
Optical Specifications
Item # R1L3S3P R1L3S3PR
Pattern LRa Chrome LRa Chrome
Background Clear Chrome
Chrome Optical Densitya ≥3.0 -
Reflectanceb - LRa Chrome: <10%
Chrome: >40%
  • Low-Reflectivity
  • Specified at 430 nm.
  • Four Grid Arrays on a 3" x 1" (76.2 mm x 25.4 mm) Soda Lime Glass Slide
  • 10 µm, 50 µm, 100 µm, and 500 µm Grid Spacings
  • Ideal for Microscopy Applications of Stage Calibration and Distortion Detection
  • Same Outer Dimensions as a Standard Microscope Slide
  • High Contrast Positive Reflective Target Available

These grid distortion targets feature four arrays of horizontal and vertical lines spaced 10 µm, 50 µm, 100 µm, and 500 µm apart. This pattern is fabricated from the deposition of low-reflectivity, vacuum-sputtered chrome on a 3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) soda lime glass substrate. The dimensions of the glass substrate are the same as a standard microscope slide.

Thorlabs offers two targets composed of a low-reflectivity chrome pattern etched on soda lime glass. The R1L3S3P positive target has the clear soda lime substrate background for for front-lit and general applications, while the R1L3S3PR positive reflective target has a chrome background for high contrast in reflective applications. See the Graphs tab for details.

Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical lines of the grid should be perpendicular to each other. A distorted image will show the lines as bowed; this image can then be used to correct for distortion.

Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R1L3S3P Support Documentation
R1L3S3PPositive Grid Distortion Target, 3" x 1", 10, 50, 100, and 500 µm Grid Spacings
$273.23
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R1L3S3PR Support Documentation
R1L3S3PRPositive Reflective Grid Distortion Target 3" x 1", 10, 50, 100, and 500 µm Grid Spacings
$273.23
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Combined Resolution and Distortion Test Target, 3" x 1"

 

Frequencies of NBS 1963A (cycles/mm)
• 4.5 • 10 • 23 • 51 • 114
• 5 • 11 • 25 • 57 • 128
• 5.6 • 12.5 • 29 • 64 • 144
• 6.3 • 14 • 32 • 72 • 161
• 7.1 • 16 • 36 • 81 • 181
• 8 • 18 • 40 • 91 • 203
• 9 • 20 • 45 • 102 • 228
Stage Micrometer
Click to Enlarge

Close Up of R1L3S5P Stage Micrometer
Optical Specifications
Pattern LRa Chrome
Background Clear
Surface Flatness ≤15 µm
Chrome Optical Densityb ≥3.0
  • Low-Reflectivity
  • Specified at 430 nm.
  • 3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) Target
  • Includes NBS 1963A Pattern, Sector Star, Concentric Circles, Grids, Ronchi Rulings, and More (See Table Below)
  • Determine Resolution of an Optical System
  • Measure Image Distortion, Astigmatism, and Other Aberrations
  • Compatible with our MLS203 Microscope Stages via MLS203P2 Slide Holder

The R1L3S5P positive 3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) combined resolution / distortion test targets that are made by vacuum-sputtering low-reflectivity chrome with an optical density of ≥3 at 430 nm on a soda lime glass substrate. They are ideal for calibration of imaging systems and microscope stages. They are sized to fit in our MLS203P2 stage slide holder for use with our MLS203 microscope stages.

The test targets include an NBS 1963A pattern, a sector (Siemens) star, concentric circles, grids, Ronchi rulings, and more (see table below). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The NBS 1963A, sector star, and concentric circle targets are useful for measuring imaging resolution. For more information, please see our Resolution Targets page. The grids can be used to measure the distortion introduced by an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability.

Target Feature Details Target Feature Details
NBS 1963A Frequencies from 4.5 cycles/mm to 228 cycles/mm (See List Above) Concentric Circles 10 Circles with Radii from 100 µm to 1000 µm in 100 µm Intervals
Distortion Grid (Squares) 3 Grids: 100 lp/mma, 150 lp/mm, 200 lp/mm Fixed Ronchi Rulings 3 Rulings:100 lp/mm, 150 lp/mm, and 200 lp/mm
Distortion Grid (Dots) 3 Grids: 400 µm Pitch of Ø80 µm Dots,
200 µm Pitch of Ø 40 µm Dots, 100 µm Pitch of Ø20 µm Dots
Variable Ronchi Rulings 20 Rulings (Each 1 mm x 1 mm): 10 lp/mm to 200 lp/mm in 10 lp/mm Intervals
Two-Point Resolution Dots Ø25 µm, Ø20 µm, Ø15 µm, Ø12.5 µm, Ø10 µm, Ø7.5 µm, and Ø5 µm Pinholes Ø25 µm, Ø20 µm, Ø15 µm, Ø12.5 µm, Ø10 µm, Ø7.5 µm, and Ø5 µm
Interdigitated Lines 6.25 lp/mm, 12.5 lp/mm, 25 lp/mm, 50 lp/mm, 100 lp/mm, and 200 lp/mm Three Micrometers 1 mm x 1 mm XY Scale with 50 µm Divisions
1 mm Scale with 10 µm Divisions
10 mm Scale with 50 µm Divisions
Sector Star 36 Bars through 360°, 50 µm Radius Center Circle, and Ten Concentric Circles with Radii from 100 µm to 500 µm in 50 µm Intervals
  • The unit lp/mm is line pairs per millimeter.
Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R1L3S5P Support Documentation
R1L3S5PCustomer Inspired! Positive Combined Resolution and Distortion Test Target, 3" x 1"
$1,090.50
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Concentric Circles & Crosshair Reticles

Numbered Concentric Circles
Click for Details

Detail of the Numbered Concentric Circles Pattern (Item # R19DS13P)
Reticle in Mounting Adapter
Click to Enlarge

R19DS13P in AD19T Mounting Adapter
  • Concentric Circles Superimposed on a Crosshair
  • Circle Diameter Spacing of 0.5 mm, 1 mm, or 5 mm
  • Positive Pattern Available in 19.0 mm, 21.0 mm, and 1" (25.4 mm) Diameters
  • Negative Pattern Available in 1" (25.4 mm) Diameter

Our concentric circles reticles consist of a centered crosshair and concentric circles increasing in diameter by 0.5 mm, 1 mm, or 5 mm. The diameters are labeled in 1 mm increments (0.5 mm and 1 mm pitch circles) or 5 mm increments (5 mm pitch circles). The pattern is formed from lines that are 10 µm wide (0.5 mm and 1 mm pitch circles) or 250 µm wide (5 mm pitch circles). Made by plating chrome onto one side of a 1.5 mm thick UV fused silica substrate, these optics provide greater than 90% transmission in the 200 - 1200 nm spectral range.

The Ø19.0 mm reticle can be adapted to Ø1" mounts by inserting it into an AD19T or SM1AD19 Mounting Adapter. The AD19T adapter has a smooth outer perimeter, making it compatible with any standard Ø1" mount, while the SM1AD19 adapter has external SM1 (1.035"-40) threading, providing the ideal match for Thorlabs' line of SM1-threaded optomechanics.

Based on your currency / country selection, your order will ship from Newton, New Jersey  
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R19DS13P Support Documentation
R19DS13PCustomer Inspired! Positive Concentric Circles & Crosshair Reticle, Ø19.0 mm, 1 mm Pitch, 10 µm Thick Lines, 10 Circles, UVFS
$75.14
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R21DS7P Support Documentation
R21DS7PCustomer Inspired! Positive Concentric Circles & Crosshair Reticle, Ø21.0 mm, 1 mm Pitch, 10 µm Thick Lines, 10 Circles, UVFS
$75.14
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R1DS2P2 Support Documentation
R1DS2P2Positive Concentric Circles & Crosshair Reticle, Ø1", 0.5 mm Pitch, 10 µm Thick Lines, 20 Circles, UVFS
$75.14
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R1DS2P Support Documentation
R1DS2PCustomer Inspired! Positive Concentric Circles & Crosshair Reticle, Ø1", 1 mm Pitch, 10 µm Thick Lines, 10 Circles, UVFS
$75.14
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R1DS2P1 Support Documentation
R1DS2P1Positive Concentric Circles & Crosshair Reticle, Ø1", 5 mm Pitch, 250 µm Thick Lines, 4 Circles, UVFS
$75.14
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R1DS2N2 Support Documentation
R1DS2N2Negative Concentric Circles & Crosshair Reticle, Ø1", 0.5 mm Pitch, 10 µm Thick Lines, 20 Circles, UVFS
$75.14
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R1DS2N Support Documentation
R1DS2NCustomer Inspired! Negative Concentric Circles & Crosshair Reticle, Ø1", 1 mm Pitch, 10 µm Thick Lines, 10 Circles, UVFS
$75.14
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R1DS2N1 Support Documentation
R1DS2N1Negative Concentric Circles & Crosshair Reticle, Ø1", 5 mm Pitch, 250 µm Thick Lines, 4 Circles, UVFS
$75.14
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Scaled Crosshair Reticles

Scaled Crosshair Pattern
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Detail of the Scaled Crosshair Pattern
  • Graduated Crosshair Extends to the Edge of the Optic 
  •  Tick Mark Spacings:
    • 10 µm up to 1 mm from Center
    • 100 µm and 1 mm up to 12 mm from Center
  • Positive and Negative Crosshairs Available in 1" (25.4 mm) Diameter

Our scaled crosshair (crossline) reticles are used to superimpose a graduated reference pattern on an object being imaged. The crosshairs span the entire diameter of the optic with a graduated scale of tick marks that go up to 12 mm from center. The first set of tick marks are 2 µm thick and are spaced every 10 µm up to 1 mm from the center (the crosshair is also 2 µm thick within this radius). The next set of tick marks are 10 µm thick and spaced every 100 µm, extending from 1 mm to 12 mm from the center (the crosshair is also 10 µm thick from 1 mm from the center to the edge of the optic). Made by plating chrome onto one side of a 1.5 mm thick UV fused silica substrate, these optics provide greater than 90% transmission in the 200 - 1200 nm spectral range.

The Ø19.0 mm reticle can be adapted to Ø1" mounts by inserting it into an AD19T or SM1AD19 Mounting Adapter. The AD19T adapter has a smooth outer perimeter, making it compatible with any standard Ø1" mount, while the SM1AD19 adapter has external SM1 (1.035"-40) threading, providing the ideal match for Thorlabs' line of SM1-threaded optomechanics.

Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R1DS3P2 Support Documentation
R1DS3P2Positive Scaled Crosshair Reticle, 10 µm, 100 µm, and 1 mm Tick Mark Spacing, Ø1", UVFS
$75.14
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R1DS3N2 Support Documentation
R1DS3N2Negative Scaled Crosshair Reticle, 10 µm, 100 µm, and 1 mm Tick Mark Spacing, Ø1", UVFS
$75.14
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Crosshair Reticles

Scaled Crosshair Pattern
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Crosshair Pattern
Reticle in Mounting Adapter
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R19DS11P in SM1AD19 Mounting Adapter
  • Crosshair Extends to the Edge of the Optic
  • Positive Crosshairs Available in 19.0 mm, 21.0 mm, and 1" (25.4 mm) Diameters
  • Negative Crosshairs Available in 1" (25.4 mm) Diameter
  • 10 µm or 25 µm Thick Lines

Our crosshair (crossline) reticles are used to superimpose a reference pattern on an object being imaged. The crosshairs span the entire diameter of the optic with lines that are 25 µm or 10 µm (Ø1" optic only) thick. Made by plating chrome onto one side of a 1.5 mm thick UV fused silica substrate, these optics provide greater than 90% transmission in the 200 - 1200 nm spectral range.

The Ø19.0 mm reticle can be adapted to Ø1" mounts by inserting it into an AD19T or SM1AD19 Mounting Adapter. The AD19T adapter has a smooth outer perimeter, making it compatible with any standard Ø1" mount, while the SM1AD19 adapter has external SM1 (1.035"-40) threading, providing the ideal match for Thorlabs' line of SM1-threaded optomechanics.

Based on your currency / country selection, your order will ship from Newton, New Jersey  
+1 Qty Docs Part Number - Universal Price Available
R19DS11P Support Documentation
R19DS11PCustomer Inspired! Positive Crosshair Reticle, Ø19.0 mm, 25 µm Thick Lines, UVFS
$75.14
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R21DS5P Support Documentation
R21DS5PCustomer Inspired! Positive Crosshair Reticle, Ø21.0 mm, 25 µm Thick Lines, UVFS
$75.14
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R1DS3P1 Support Documentation
R1DS3P1Positive Crosshair Reticle, Ø1", 10 µm Thick Lines, UVFS
$75.14
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R1DS3P Support Documentation
R1DS3PCustomer Inspired! Positive Crosshair Reticle, Ø1", 25 µm Thick Lines, UVFS
$75.14
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R1DS3N1 Support Documentation
R1DS3N1Negative Crosshair Reticle, Ø1", 10 µm Thick Lines, UVFS
$75.14
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R1DS3N Support Documentation
R1DS3NCustomer Inspired! Negative Crosshair Reticle, Ø1", 25 µm Thick Lines, UVFS
$75.14
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