Calibration Targets

Microscope Slides & Reticles for Imaging System Calibration
Soda Lime or UV Fused Silica Substrates with Chrome Plating

R1L3S1P

Stage Micrometer
with 50 µm Divisions

R3L3S3P

Concentric Squares Target,
0.1 mm to 50 mm

R2L2S3P1

Grid Distortion Target,
125 µm Grid Spacing

R1L3S12N

Ronchi Ruling Target,
10 lp/mm Pattern

R3L3S5P

Concentric Circles and Crosshairs Grid Target

R1DS2P

Concentric Circles Reticle

Related Items

Fluorescent Calibration Slides

Slide and Target Holders

High-Speed Microscopy Stage

Objective and Scan Lenses

Annular Aperture Obstruction Targets

Scientific-Grade Cameras

Imaging Systems Overview

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Overview
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Custom Capabilities
Cleaning
Feedback

General Specifications
Optic Type	Slides & Targets	Reticles^a
Chrome Thickness	0.120 µm
Chrome Optical Density	OD ≥3 at 430 nm
Substrate Thickness	0.06" (1.5 mm)
Surface Flatness	≤15 µm	N/A
Surface Quality	N/A	60-40 S-D
Transmitted Wavefront Error	N/A	<λ at 633 nm
Line Spacing Tolerance^b	±1 µm	N/A
Line Width Tolerance^b	±0.5 µm	N/A
Diameter Tolerance	N/A	+0.0/-0.1 mm
Substrate	Soda Lime Glass	UV Fused Silica^c

Click here for the full reticles web presentation.
This tolerance is valid for the mask used to create these targets and may differ minimally for the targets themselves.
Click the link for detailed substrate specifications.

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An R3L3S3P Stage Micrometer Mounted in an XYF1 Test Target Positioner

Quick Links

Horizontal Stage Micrometers with Divisions from 10 µm to 100 µm (1" x 1" or 3" x 3")
Concentric Squares with Positive Pattern Sizes from 0.1 mm to 50 mm (3" x 3")
Single-Frequency Ronchi Ruling Targets (3" x 1")
Concentric Circles and Crosshairs Grid Target (3" x 3")
Combined Resolution and Distortion Test Targets (18 mm x 18 mm)
Grid Distortion Targets (1.5" x 1.5" or 3" x 1")
Combined Resolution and Distortion Test Target with Stage Micrometers (3" x 1")
Concentric Circles & Crosshair Reticles (Ø19.0 mm, Ø21.0 mm, or Ø1")

Thorlabs' calibration targets include stage micrometers, concentric squares and circles, distortion targets, and reticles for calibrating an imaging system. Square and rectangular targets feature soda lime glass substrates with vacuum-sputtered, low-reflectivity chrome, while our reticles feature UV fused silica substrates and high-reflectivity chrome. Each pattern is manufactured using photolithography, allowing for edge features to be resolved down to approximately 1 µm.

Mounting
Rectangular calibration targets can be mounted in many of our microscope slide holders, such as general fixed slide holders, microscope slide holders, and translation stages for microscopy. We also offer fixed optic holders for mounting reticles.

Targets Selection Guide
Resolution Test Targets	Calibration Targets	Distortion Test Targets	Slant Edge MTF Target	Stage Micrometers

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Soda Lime Glass Transmission

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Spectral Curves of Reflective Test Targets
The large difference between the chrome (blue line) and low-reflectivity chrome (red line) in the visible region means that the positive reflective targets have high contrast between the pattern and the background.

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The transmission plot was measured at normal incidence using a UV fused silica substrate that was 1.0 mm thick. The transmission for the reticles sold here will be slightly lower because of their 1.5 mm thickness.

Jason Williamson
General Manager
Thorlabs Spectral Works

Questions?
Need a Quote?

Customization Parameters
Substrate Size^a	Min	8 mm x 8 mm (5/16" x 5/16")
Substrate Size^a	Max	85 mm x 85 mm (3.35" x 3.35")
Substrate Materials		Soda Lime Glass UV Fused Silica Quartz
Coating Material		Chrome^b Low-Reflectivity Chrome^c
Coating Optical Density		≥3^d or ≥6^e @ 430 nm
Minimum Pinhole/Spot		Ø1 µm
Minimum Line Width		1 µm
Line Width Tolerance		-0.25 / +0.50 µm
Maximum Line Density		500 lp/mm

Substrates can be diced to custom shapes and sizes.
Chrome Reflectance >40% at 430 nm
Low-Reflectivity Chrome Reflectance >10% at 430 nm
Optical densities of ≥3 at 430 nm for UV fused silica substrates and standard soda lime substrates.
Optical density of ≥6 at 430 nm for quartz substrates and select soda lime substrates.

Custom OEM Test Targets and Reticles

Our in-house photolithographic design and production capabilities enable us to create a range of patterned optics. We manufacture test targets, distortion grids, and reticles at our Thorlabs Spectral Works facility in Columbia, South Carolina. These components have served a wide variety of applications, being implemented in microscopes, imaging systems, and optical alignment setups.

In addition to our catalog test targets and reticles offered from stock, we can provide custom chrome patterns on soda lime, UV fused silica, or quartz substrates from 8 mm by 8 mm up to 85 mm by 85 mm. Substrates can be cut to shape for your application. Our photolithographic coating process allows us to create chrome features down to 1 µm. A few sample patterns are shown below, which can be made positive or negative, as shown in the image directly below.

For a quote on custom test targets and reticles, please contact us at TSW@thorlabs.com.

Sample Patterns

Example Applications

Etched Reticles
Gray Scale Masks
Resolution Reticles
Diagnostic Reticles
Recreational Scopes
Notching Reticles
Eyepiece Scales
Illuminated Crosshairs
Obstruction Targets
Binocular Reticles

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Positive and Negative Crosshair Sample Pattern

This tab details an optimal cleaning technique developed by our engineers for cleaning reticles, test targets, distortion targets, and calibration targets.

Cleaning Procedure

Use a clean wet sponge, preferably made of polyvinyl alcohol (PVA), and dish detergent to gently scrub the front and back surfaces of your reticle or target.
Rinse with water.
Blow dry with clean dry air, or allow the reticle or target to air dry on a clean surface.

We do not suggest using a towel, rag, or wipe to dry the surface. If contamination persists, soak the reticle or target in a detergent and water solution for 1 hour, repeating as necessary.

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Stage Micrometer, 1" x 1"

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Close Up of the R1L1S5P Horizontal Scale with Crosshair

1" x 1" (25.4 mm x 25.4 mm) Stage Micrometer
For Calibrating Eyepiece Reticles or Objective Magnification
20 mm Horizontal Scale with 100 µm Divisions and Crosshair

This target features a stage micrometer pattern with 100 µm divisions and numerical labeling every 1 mm. The pattern is oriented horizontally with a 20 mm long scale and a perpendicular crosshair. The target consists of a 1" x 1" soda lime substrate with low-reflectivity, vacuum-sputtered chrome. This positive target is useful for the calibration of distances within imaging systems.

Stage Micrometers, 3" x 1"

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Microscope Image of R1L3S1P Stage Micrometer

For Calibrating Eyepiece Reticles or Objective Magnification
R1L3S1P: 10 mm Scale with 50 µm Divisions
R1L3S2P: 1 mm Scale with 10 µm Divisions
Scales Centered on a 3" x 1" (76.2 mm x 25.4 mm) Microscope Slide

These targets each feature a horizontal stage micrometer pattern. The R1L3S1P micrometer has a 10 mm long scale with 50 µm divisions and numerical labeling every millimeter, while the R1L3S2P has a 1 mm long scale with 10 µm divisions and numerical labeling every 0.1 mm. Both targets consist of a 3" x 1" soda lime substrate with low-reflectivity, vacuum-sputtered chrome. These positive targets are useful for the calibration of distances within imaging systems.

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R1L3S1P Under Magnification

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R1L3S2P Under Magnification

Concentric Squares Test Target, 3" x 3"

Concentric Squares Test Target, 3in x 3in

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R3L3S3P Concentric Square Pattern

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Close Up of the Squares Smaller than 15 mm Wide on R3L3S3P Concentric Square Target

3" x 3" (76.2 mm x 76.2 mm) Concentric Square Target
Calibrate a Measurement for Imaging Software
Low-Reflectivity, Vacuum-Sputtered Chrome

The R3L3S3P Concentric Square Target features fourteen concentric squares with lengths and widths ranging from 0.1 mm to 50 mm (see table below). Each square is labeled with its width on the target. This target is made from a soda lime glass substrate with low-reflectivity, vacuum-sputtered chrome. These positive targets are useful for the calibration of distances within imaging systems.

Widths of Positive Squares (mm)

	• 0.1	• 0.5	• 2	• 4	• 10	• 20	• 40
	• 0.25	• 1	• 3	• 5	• 15	• 30	• 50

Single-Frequency Ronchi Ruling Targets, 3" x 1"

Single-Frequency Ronchi Ruling Targets, 3in x 1in

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Close Up of R1L3S14N Ronchi Ruling Pattern

Optical Specifications
Pattern	LR^a Chrome
Background	Clear
Chrome Optical Density^b	≥3.0

Low-Reflectivity
Specified at 430 nm.

3" x 1" (76.2 mm x 25.4 mm) Square Wave Ronchi Ruling Target
Patterns with 10 lp/mm, 20 lp/mm, 40 lp/mm, and 80 lp/mm
Large 65 mm x 17 mm Clear Aperture
Determine Resolution, Field Distortion, and Parfocal Stability in an Optical System
Low-Reflectivity, Vacuum-Sputtered Chrome on Soda Lime Glass
Compatible with our MLS203 Microscope Stages via MLS203P2 Slide Holder

Thorlabs offers four versions of Ronchi ruling targets with resolutions ranging from 10 line pairs (one light line and one dark line) per millimeter (lp/mm) to 80 lp/mm. These square wave, constant-interval bar and space patterns are fabricated from the deposition of a low-reflectivity chrome pattern on a 3.00" x 1.00" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) soda lime glass substrate. This leaves a large 65 mm x 17 mm clear aperture, and works well in back-lit and highly illuminated applications. The dimensions of the glass substrate are the same as a standard microscope slide. These Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability in optical systems.

Concentric Circles and Crosshairs Grid Target, 3" x 3"

Concentric Circles and Crosshairs Grid Target, 3in x 3in

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Close Up of the Smaller Grid on the R3L3S5P Target with Labels Added (See Tables Below)

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Close Up of Entire Pattern on the R3L3S5P Target

Optical Specifications
Pattern	LR^a Chrome
Background	Clear
Surface Flatness	≤15 µm
Chrome Optical Density^b	≥3.0

Low-Reflectivity
Specified at 430 nm.

Concentric Circles and Crosshair Patterns Arranged in a Grid
Four Different Concentric Circle Sizes and Five Different Crosshair Sizes
Measure Resolution, Distortion, and Magnification of an Imaging System
3" x 3" (76.2 mm x 76.2 mm) Soda Lime Glass Substrate

Thorlabs' 3" x 3" (76.2 mm x 76.2 mm) Concentric Circles and Crosshairs Grid Target offers 289 individual grids, arranged in a larger, 2" x 2" grid of 17 rows and 17 columns. The smaller grids each have four concentric circle patterns and five crosshair patterns of varying sizes. The concentric circle and crosshair patterns on the smaller grids are labeled in the image to the right but not on the target itself. Each concentric circle pattern features seven different radii, while the crosshairs each have a single or a double cross. For details on the dimensions of these patterns, see the tables below.

The pattern on this target is made from plating low-reflectivity, vacuum-sputtered chrome on a 0.06" (1.5 mm) thick soda lime glass substrate to achieve an optical density of ≥3 at 430 nm. The dark pattern and clear substrate are useful for front-lit and general applications.

Concentric Circles
Circle Pattern^a	R₁	R₂	R₃	R₄	R₅	R₆	R₇
A1	31.3 µm	62.5 µm	125 µm	140.6 µm	234.4 µm	242.2 µm	500 µm
A2	15.6 µm	31.3 µm	62.5 µm	70.3 µm	117.2 µm	121.1 µm	250 µm
A3	7.8 µm	15.6 µm	31.3 µm	35.2 µm	58.6 µm	60.5 µm	125 µm
A4	3.9 µm	7.8 µm	15.6 µm	17.6 µm	29.3 µm	30.3 µm	62.5 µm

As indicated by the photo above and to the right.

Crosshairs
Crosshair Pattern^a	Single or Double Line	Length/Width	Line Width^b
B1	Double	500 µm	6.25 µm
B2	Double	500 µm	12.5 µm
B3	Single	500 µm	50 µm
B4	Double	500 µm	25 µm
B5	Double	500 µm	100 µm

As indicated by the photo above and to the right.
The line width is equal to the spacing between the lines.

Combined Resolution and Distortion Test Targets, 18 mm x 18 mm

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Microscope Image of the R1S1L1N Negative Test Target

Optical Specifications
Item #	R1L1S1P	R1L1S1N
Pattern	LR^a Chrome	Clear
Background	Clear	LR^a Chrome
Chrome Optical Density^b	≥3.0

Low-Reflectivity
Specified at 430 nm.

Determine Resolution of an Optical System
Measure Image Distortion, Astigmatism, and Other Aberrations
18 mm (0.71") Square, 1.5 mm Thick Soda Lime Substrate
Includes 1951 USAF Pattern, Sector Star, Concentric Circles, Grids, and Ronchi Rulings
Positive and Negative Targets Available

Thorlabs offers positive and negative 18 mm x 18 mm x 1.5 mm combined resolution / distortion test targets that are made by plating low-reflectivity, vacuum-sputtered chrome with an optical density (OD) of ≥3.0 at 430 nm on a soda lime glass substrate. They are ideal for the calibration of imaging systems and microscope stages.

The test targets include a 1951 USAF pattern (Groups 2 - 7), a sector star, concentric circles, grids (100 µm, 50 µm, and 10 µm), and Ronchi rulings (30 - 150 lp/mm). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The 1951 USAF targets are useful for measuring imaging resolution. The grids can be used to measure image distortion, while the concentric circles are ideal for identifying focus errors, astigmatism, and other aberrations existing in an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability. For more information, please see our Resolution Targets page.

These resolution targets are offered in positive and negative versions. The R1L1S1P positive target consists of a low-reflectivity chrome pattern plated on to a clear substrate and is useful for front-lit and general applications. Alternatively, the R1L1S1N negative target uses the same low-reflectivity chrome coating to cover the substrate, leaving the pattern itself clear, and works well in back-lit and highly illuminated applications.

Target Feature	Details	Target Feature	Details
1951 USAF Target	Groups 2 - 7	Concentric Circles	10 Circles with Radii from 100 µm to 1000 µm in 100 µm Intervals, Labeled 1 to 10
Grids	20 x 20 Arrays with 100 µm, 50 µm, and 10 µm Pitch	Ronchi Rulings	13 Rulings from 30 lp/mm^a to 150 lp/mm in 10 lp/mm Intervals
Sector Star	36 Bars through 360°, 10 µm Radius Center Circle, and Ten Concentric Circles with Radii from 50 µm to 500 µm in 50 µm Intervals

Line Pairs per Millimeter

Fixed Frequency Grid Distortion Targets, 1.5" x 1.5"

Fixed Frequency Grid Distortion Targets, 1.5in x 1.5in

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An R2L2S3P3 Target Post Mounted via an FFM1 Filter Mount and a B3C Cube Base for Use in a Custom Imaging System

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A Close Up of the Dot Pattern on the R2L2S3P4 Target

One Grid Array on a 1.5" x 1.5" (38.1 mm x 38.1 mm) Soda Lime Glass Substrate
125 µm, 250 µm, 500 µm, or 1000 µm Grid Spacings
Ø62.5 µm, Ø125 µm, Ø250 µm, or Ø500 µm Dots
Ideal for Machine Vision Applications of Stage Calibration and Distortion Detection

These distortion grid arrays each feature a single grid of dots fabricated from the deposition of vacuum-sputtered, low-reflectivity chrome on a soda lime glass substrate. The available grid spacings, which are measured from the center of any dot to the center of any adjacent dot, range from 125 µm to 1000 µm, and the dot diameters range from 62.5 µm to 500 µm.

Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical rows of dots should be perpendicular to each other. A distorted image will show the array as bowed; this image can then be used to correct for distortion.

Item #	Spacing^a	Spacing Tolerance	Dot Size	Dot Size Tolerance	Pattern	Background	Pattern Size^b	Pattern Size Tolerance	Pattern Optical Density	Substrate Size
R2L2S3P1	125 µm	±1 µm	Ø62.5 µm	±2 µm	Low-Reflectivity Chrome	Clear	25.0 mm x 25.0 mm (0.98" x 0.98")	±4 µm	OD ≥3.0 at 430 nm	1.5" x 1.5" x 0.06" (38.1 mm x 38.1 mm x 1.5 mm)
R2L2S3P2	250 µm		Ø125 µm				25.0 mm x 25.0 mm (0.98" x 0.98")
R2L2S3P3	500 µm		Ø250 µm				25.4 mm x 25.4 mm (1" x 1")
R2L2S3P4	1000 µm		Ø500 µm				25.4 mm x 25.4 mm (1" x 1")

Measured from the center of any dot to the center of any adjacent dot.
Measured from corner to corner on the grid array.

Multi-Frequency Grid Distortion Target, 3" x 1"

Multi-Frequency Grid Distortion Target, 3in x 1in

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Close Up of the Four Grid Patterns on the R1L3S3P Target

Optical Specifications
Item #	R1L3S3P	R1L3S3PR
Pattern	LR^a Chrome	LR^a Chrome
Background	Clear	Chrome
Chrome Optical Density^a	≥3.0	-
Reflectance^b	-	LR^a Chrome: <10% Chrome: >40%

Low-Reflectivity
Specified at 430 nm.

Four Grid Arrays on a 3" x 1" (76.2 mm x 25.4 mm) Soda Lime Glass Slide
10 µm, 50 µm, 100 µm, and 500 µm Grid Spacings
Ideal for Microscopy Applications of Stage Calibration and Distortion Detection
Same Outer Dimensions as a Standard Microscope Slide
High Contrast Positive Reflective Target Available

These grid distortion targets feature four arrays of horizontal and vertical lines spaced 10 µm, 50 µm, 100 µm, and 500 µm apart. This pattern is fabricated from the deposition of low-reflectivity, vacuum-sputtered chrome on a 3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) soda lime glass substrate. The dimensions of the glass substrate are the same as a standard microscope slide.

Thorlabs offers two targets composed of a low-reflectivity chrome pattern etched on soda lime glass. The R1L3S3P positive target has the clear soda lime substrate background for for front-lit and general applications, while the R1L3S3PR positive reflective target has a chrome background for high contrast in reflective applications. See the Graphs tab for details.

Grid arrays are used to determine the distortion of an imaging system. Ideally, the horizontal and vertical lines of the grid should be perpendicular to each other. A distorted image will show the lines as bowed; this image can then be used to correct for distortion.

Combined Resolution and Distortion Test Target, 3" x 1"

Combined Resolution and Distortion Test Target, 3in x 1in

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Frequencies of NBS 1963A (cycles/mm)

• 4.5	• 10	• 23	• 51	• 114
• 5	• 11	• 25	• 57	• 128
• 5.6	• 12.5	• 29	• 64	• 144
• 6.3	• 14	• 32	• 72	• 161
• 7.1	• 16	• 36	• 81	• 181
• 8	• 18	• 40	• 91	• 203
• 9	• 20	• 45	• 102	• 228

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Close Up of R1L3S5P Stage Micrometer

Optical Specifications
Pattern	LR^a Chrome
Background	Clear
Surface Flatness	≤15 µm
Chrome Optical Density^b	≥3.0

Low-Reflectivity
Specified at 430 nm.

3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) Target
Includes NBS 1963A Pattern, Sector Star, Concentric Circles, Grids, Ronchi Rulings, and More (See Table Below)
Determine Resolution of an Optical System
Measure Image Distortion, Astigmatism, and Other Aberrations
Compatible with our MLS203 Microscope Stages via MLS203P2 Slide Holder

The R1L3S5P positive 3" x 1" x 0.06" (76.2 mm x 25.4 mm x 1.5 mm) combined resolution / distortion test targets that are made by vacuum-sputtering low-reflectivity chrome with an optical density of ≥3 at 430 nm on a soda lime glass substrate. They are ideal for calibration of imaging systems and microscope stages. They are sized to fit in our MLS203P2 stage slide holder for use with our MLS203 microscope stages.

The test targets include an NBS 1963A pattern, a sector (Siemens) star, concentric circles, grids, Ronchi rulings, and more (see table below). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The NBS 1963A, sector star, and concentric circle targets are useful for measuring imaging resolution. For more information, please see our Resolution Targets page. The grids can be used to measure the distortion introduced by an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability.

Target Feature	Details	Target Feature	Details
NBS 1963A	Frequencies from 4.5 cycles/mm to 228 cycles/mm (See List Above)	Concentric Circles	10 Circles with Radii from 100 µm to 1000 µm in 100 µm Intervals
Distortion Grid (Squares)	3 Grids: 100 lp/mm^a, 150 lp/mm, 200 lp/mm	Fixed Ronchi Rulings	3 Rulings:100 lp/mm, 150 lp/mm, and 200 lp/mm
Distortion Grid (Dots)	3 Grids: 400 µm Pitch of Ø80 µm Dots, 200 µm Pitch of Ø 40 µm Dots, 100 µm Pitch of Ø20 µm Dots	Variable Ronchi Rulings	20 Rulings (Each 1 mm x 1 mm): 10 lp/mm to 200 lp/mm in 10 lp/mm Intervals
Two-Point Resolution Dots	Ø25 µm, Ø20 µm, Ø15 µm, Ø12.5 µm, Ø10 µm, Ø7.5 µm, and Ø5 µm	Pinholes	Ø25 µm, Ø20 µm, Ø15 µm, Ø12.5 µm, Ø10 µm, Ø7.5 µm, and Ø5 µm
Interdigitated Lines	6.25 lp/mm, 12.5 lp/mm, 25 lp/mm, 50 lp/mm, 100 lp/mm, and 200 lp/mm	Three Micrometers	1 mm x 1 mm XY Scale with 50 µm Divisions 1 mm Scale with 10 µm Divisions 10 mm Scale with 50 µm Divisions
Sector Star	36 Bars through 360°, 50 µm Radius Center Circle, and Ten Concentric Circles with Radii from 100 µm to 500 µm in 50 µm Intervals

The unit lp/mm is line pairs per millimeter.

Concentric Circles & Crosshair Reticles

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Detail of the Numbered Concentric Circles Pattern (Item # R19DS13P)

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R19DS13P in AD19T Mounting Adapter

Concentric Circles Superimposed on a Crosshair
Circle Diameter Spacing of 0.5 mm, 1 mm, or 5 mm
Positive Pattern Available in 19.0 mm, 21.0 mm, and 1" (25.4 mm) Diameters
Negative Pattern Available in 1" (25.4 mm) Diameter

Our concentric circles reticles consist of a centered crosshair and concentric circles increasing in diameter by 0.5 mm, 1 mm, or 5 mm. The diameters are labeled in 1 mm increments (0.5 mm and 1 mm pitch circles) or 5 mm increments (5 mm pitch circles). The pattern is formed from lines that are 10 µm wide (0.5 mm and 1 mm pitch circles) or 250 µm wide (5 mm pitch circles). Made by plating chrome onto one side of a 1.5 mm thick UV fused silica substrate, these optics provide greater than 90% transmission in the 200 - 1200 nm spectral range.

The Ø19.0 mm reticle can be adapted to Ø1" mounts by inserting it into an AD19T or SM1AD19 Mounting Adapter. The AD19T adapter has a smooth outer perimeter, making it compatible with any standard Ø1" mount, while the SM1AD19 adapter has external SM1 (1.035"-40) threading, providing the ideal match for Thorlabs' line of SM1-threaded optomechanics.

Based on your currency / country selection, your order will ship from Newton, New Jersey

+1 Qty Docs Part Number - Universal Price Available

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R1DS2P1 Positive Concentric Circles & Crosshair Reticle, Ø1", 5 mm Pitch, 250 µm Thick Lines, 4 Circles, UVFS

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R1DS2N2 Negative Concentric Circles & Crosshair Reticle, Ø1", 0.5 mm Pitch, 10 µm Thick Lines, 20 Circles, UVFS

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Scaled Crosshair Reticles

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Detail of the Scaled Crosshair Pattern

Graduated Crosshair Extends to the Edge of the Optic
Tick Mark Spacings:
- 10 µm up to 1 mm from Center
- 100 µm and 1 mm up to 12 mm from Center
Positive and Negative Crosshairs Available in 1" (25.4 mm) Diameter

Our scaled crosshair (crossline) reticles are used to superimpose a graduated reference pattern on an object being imaged. The crosshairs span the entire diameter of the optic with a graduated scale of tick marks that go up to 12 mm from center. The first set of tick marks are 2 µm thick and are spaced every 10 µm up to 1 mm from the center (the crosshair is also 2 µm thick within this radius). The next set of tick marks are 10 µm thick and spaced every 100 µm, extending from 1 mm to 12 mm from the center (the crosshair is also 10 µm thick from 1 mm from the center to the edge of the optic). Made by plating chrome onto one side of a 1.5 mm thick UV fused silica substrate, these optics provide greater than 90% transmission in the 200 - 1200 nm spectral range.

Crosshair Reticles

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Crosshair Pattern

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R19DS11P in SM1AD19 Mounting Adapter

Crosshair Extends to the Edge of the Optic
Positive Crosshairs Available in 19.0 mm, 21.0 mm, and 1" (25.4 mm) Diameters
Negative Crosshairs Available in 1" (25.4 mm) Diameter
10 µm or 25 µm Thick Lines

Our crosshair (crossline) reticles are used to superimpose a reference pattern on an object being imaged. The crosshairs span the entire diameter of the optic with lines that are 25 µm or 10 µm (Ø1" optic only) thick. Made by plating chrome onto one side of a 1.5 mm thick UV fused silica substrate, these optics provide greater than 90% transmission in the 200 - 1200 nm spectral range.